螢光X線檢查裝置XED-10 X-ray

WEEE.RoHS/ELV規制對應
螢光X線檢查裝置 ED-10

X-ray Fluorescence Spectrometer
同時測定RoHS規制有害之元素
不需依據液體氮 簡單且快速測定
1.放置樣品
沒有繁雜的前製處理作業
只需將測定部位安置即可快速測定
2.按鈕確認即可
在自動測定模式上,對應測定試料,選擇樹脂或是金屬即可。
在前置判定機能上,樹脂的氯乙烯、非氯乙烯的判別,金屬則有鐵、銅合金、有鉛錫、無鉛錫、鋁合金等基本材料的判別,用自動且最適合執行條件進行測定。
3.用100秒同時測定5種有害元素
只需100秒即可同時測定被指定的有害元素( 鎘、鉛、汞、溴、鉻)
與過去其他廠商進行測定例的比較,有2~10倍測定生產性提升。

 


 

PWS1000/2000 高速波感測器

This sensor can measure the optical aberration in real time.
Availability of full inspection improves the production yields and diminishes the problems.
High compatibility with interferometer.
Lower cost compared to the optical interferometer.
This system can measure high aberration lens which is not supported by interferometer (e.g. single lens of digital camera).

 

 

AOIICT租賃企

只要支付使用期間的設備費用即可完全不必承擔持有設備的風險也能取得最新的技術。您可以輕易地將設備歸還、升級或增加選項以維持競爭力..............詳細方案說明

 

JVC AOI
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VFS-2300 Catalogue

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Product Details for Shindenshi ESV-304HS Solder Inspector.

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Product Details for Shindenshi ESI-2002.

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